Dr.Yan,Aibin is a Full Professor, PhD Supervisor and "Huangshan" Outstanding Young Scholar, with the National Demonstrative School of Microelectronics, Hefei University of Technology (HFUT), China. In recent years, he received a Distinguished Young Scholar Fund of Anhui Provincial Department of Education and was funded by an Outstanding Young Talent Support Program Key Project of Anhui Provincial Universities. In 2021, he created the Anhui University Institute of Chip Design and Test serving as a director. In 2022, he was reported & selected by Stanford University as one of the world top 2% scientists as well as the only selected scholar of China mainland "211 university" in the field of computer hardware & architecture. He is now an Expert in the Library of both Anhui and Guangdong Provincial Department of Science & Technology of China, a Technical Committee Member on Fault Tolerant Computing as well as Integrated Circuit Design of CCF. He is an Editorial Board Member of IEEE TVLSI, an Editorial Board Member (currently the 2nd person from China mainland) of the Journal of Electronic Testing, and a young Editorial Board Member of the Microelectronics & Computer Journal of China. During 2018.9-2019.9, he visited the WEN Lab, Kyushu Institute of Technology, Japan, under the support of China Scholarship Council (CSC), and under the supervision of Prof. Xiaoqing WEN, an IEEE Fellow, for a full year of time. During that year, he participated in chip design, tape out and test. He is now an IEEE/CCF Senior Member and a CIE Tenure Member.
In recent years, he served as a Session Chair of 52nd IEEE International Symposium on Circuits and Systems (2020), Program Chair of the CCF Inspiring Conference (National Advanced IC Technology Conference, 1st for CCF CFTC), Tutorial Chair and TPC Member of 32nd IEEE Asian Test Symposium (2023), Publicity Chair and TPC Member of 27th IEEE Asian Test Symposium (2018), Session Chair of 5th IEEE International Test Conference in Asia (2021), Forum Chair of 18th China National Computer Congress (2021), Publicity Chair of 20th China Fault Tolerance Conference (2023), Session Chair of the 2nd CCF IC Design and Automation Conference, Chair of CCF@U & Aerospace Integrated Circuit Summit Forum, Project Reviewer of National Natural Science Foundation of China, PhD/MSE Dissertation Reviewer of the Degree Center of the Ministry of Education, and Reviewer for IEEE TCAD, IEEE TIE, IEEE TAES, IEEE TETC, IEEE TCASI/II, IEEE TR, IEEE TVLSI, IEEE Tnano, IEEE TDMR, IEEE TNS, ACM TODAES, etc. He illustrated regular/poster papers for 30+ times in international conferences. He received a Best Paper Award in China Test Conference (2018), a Best Paper Candidate Award in GLSVLSI (2022), a Best Paper Award in AsianHOST (2022), the First Prize of Anhui Province Teaching Achievement Award, and a China National Award of "Challenge Cup" Extracurricular Academic and Technological Works Competition as well as an Anhui Provincial Grand-Prize Award (Tutor). In recent years, he served as a supervisor of 28 master students including a PhD candidate and his 6 master students respectively received 20,000 RMB China Scholarship Award in 2020~2022. His master students also received Provincial Outstanding Graduate Award as well as Outstanding Master Thesis Award, Pacemaker for Merit Student Award and Pacesetter for Outstanding Graduate Award. He also guided students to obtain National College Student Innovation and Entrepreneurship Projects to obtain excellent conclusions for several times.
He published roughly 100+ technical papers, such as IEEE TC, TVLSI, TCAD, TETC, TAES, TCASI/II, TR, TDMR, DAC, DATE, ICCD, DSN, ATS, VTS, ISCAS, ITC-Asia. His six published papers in IEEE TCAD, TVLSI, TETC and TAES were selected as ESI Highly Cited (Hot) Papers. He presented his research for 30+ times in International Conferences, such as IEEE DAC, DATE, ICCD, DSN, ISCAS, ATS, VTS, DSA, ITC-Asia, etc. He now holds 20 China Patents about fault tolerance of integrated circuits as well as 2 released software copyright about integrated circuit simulations. He was funded by 12 National or Provincial Natural Science Foundation of China as investigator for half of them. His research interests include fault-tolerance and test of digital circuits, soft error rate analysis, QCA quantum circuit design, memory design and computing in memory based on new RAMs, and aerospace micro-system design.
E-mail: yaibin@ustc.edu
